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Debug & Test
Nothing is Impossible... During Assembly Testing! - Blog
July 22, 2024The latest requirements are constantly challenging test engineers with new tasks
The increased use of highly integrated electronic circuits is presenting new challenges for test engineers in manufacturing. Miniaturization often limits the number of applicable test methodologies. Test systems proven over several decades, such as in-circuit test (ICT) or flying-probe test, are reaching their limits because it is no longer possible to contact all the points needed for good coverage.
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